Capable of seeing structure and composition and adding/removing material at nanometer scale, Helios NanoLab™ G3 DualBeam™ allows scientists to explore fundamental relationships between structure and function. CX configuration offers versatile sample handling and positioning for flexible analysis, sample preparation, and characterization, while UC configuration delivers increased sensitivity to surface detail and optimized performance on soft, non-conductive, or beam-sensitive materials.
This story is related to the following:Materials Characterization Instruments