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Efficiently Harnessing Low Frequency Vibrations As Infinite Power Source For Miniature Electronic Devices
2014-02-10 05:32:43| wirelessdesignonline News Articles
Battery replacement may soon be a thing of the past. Researchers from A*STAR's Institute of Microelectronics (IME) are tapping into low frequency vibrations, the most abundant and ubiquitous energy source in the surroundings, to power small-scale electronic devices indefinitely.
Tags: power
low
source
electronic
Efficiently Harnessing Low Frequency Vibrations As Infinite Power Source For Miniature Electronic Devices
2014-02-10 05:32:43| rfglobalnet News Articles
Battery replacement may soon be a thing of the past. Researchers from A*STAR's Institute of Microelectronics (IME) are tapping into low frequency vibrations, the most abundant and ubiquitous energy source in the surroundings, to power small-scale electronic devices indefinitely.
Tags: power
low
source
electronic
Comparison Of Time Domain Scans And Stepped Frequency Scans In EMI Test Receivers
2014-02-09 17:17:09| rfglobalnet Downloads
The paper compares the measurement speed and level measurement accuracy of a conventional stepped frequency scan versus an advanced FFT-based time domain scan. By Matthias Keller
Tags: time
test
comparison
domain
Harness low frequency vibrations to power miniature devices
2014-02-07 15:31:36| Semiconductors - Topix.net
A team of researchers from A*STAR's Institute of Microelectronics has looked into low frequency vibrations, the most abundant and ubiquitous energy source in the surroundings, to power small-scale electronic devices.
Tags: power
low
devices
frequency
USB Power Sensors offer frequency range to 67 GHz.
2014-01-31 14:31:50| Industrial Newsroom - All News for Today
Offering measurement speed of 900 readings/sec, U8480 Series USB Thermocouple Power Sensors feature power linearity of less than 0.8%. Real-time measurement uncertainty feature cuts overall test time by eliminating need for manual measurement uncertainty calculations. By correcting mismatch errors caused by inserted components between device-under-test and power sensor, S-parameter and gamma correction functions further optimize measurement accuracy. This story is related to the following:Test and Measuring InstrumentsSensors | Measuring Instruments |
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