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Tag: measurement
Anritsu Company Introduces Isotropic Antennas To Expand EMF Measurement System Capability
2015-11-09 11:04:16| rfglobalnet Home Page
Anritsu Company expands its Electromagnetic Field (EMF) Measurement System with the introduction of isotropic antennas that provide frequency coverage from 9 kHz to 6 GHz. The new antennas support measurements of EMF radiation to ensure wireless networks are in compliance with various national standards for personal safety established by government regulatory authorities.
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measurement
Flow Measurement Made Easy : A Solution For Every Application
2015-11-09 09:44:21| chemicalonline Downloads
To operate any process efficiently, it is essential to measure, control, actuate and record. With ABB’s measurement and analytics products and solutions, you receive the best technology combined with the most reliable products available on the market.
Tags: made
every
easy
application
Flow Measurement Made Easy : A Solution For Every Application
2015-11-09 09:44:21| oilandgasonline Downloads
To operate any process efficiently, it is essential to measure, control, actuate and record. With ABB’s measurement and analytics products and solutions, you receive the best technology combined with the most reliable products available on the market.
Tags: made
every
easy
application
Flow Measurement Made Easy : A Solution For Every Application
2015-11-09 09:44:21| pulpandpaperonline Downloads
To operate any process efficiently, it is essential to measure, control, actuate and record. With ABB’s measurement and analytics products and solutions, you receive the best technology combined with the most reliable products available on the market.
Tags: made
every
easy
application
Scanning Slit Laser Beam Profiler offers sub-micron measurement.
2015-11-05 14:31:06| Industrial Newsroom - All News for Today
Using moving slits, NIST-calibrated NanoScan™ 2s measures beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. Offering of silicon, germanium, or pyroelectric detectors allows profiling lasers of any wavelength, from UV to far infrared, to 100 µm and beyond. Digital controller, by providing 16-bit digitization of signal for dynamic range up to 35 dB power, enables measurement of beam size and pointing with 3-sigma precision to several hundred nanometers.
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