Home › Agilent Technologies' Waveform Generator/Fast Measurement Unit Used In NBTI Industry Defining Solution Research At IIT Bombay
 

Keywords :   


Agilent Technologies' Waveform Generator/Fast Measurement Unit Used In NBTI Industry Defining Solution Research At IIT Bombay

2014-06-06 12:25:30| rfglobalnet Home Page

Agilent Technologies Inc. recently announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.

Tags: research industry unit solution

Category:Telecommunications

Latest from this category

All news
»
05.11Tropical Storm Rafael Graphics
05.11Tropical Storm Rafael Forecast Discussion Number 9
05.11Tropical Storm Rafael Wind Speed Probabilities Number 9
05.11Tropical Storm Rafael Public Advisory Number 9
05.11Summary for Tropical Storm Rafael (AT3/AL182024)
05.11Tropical Storm Rafael Forecast Advisory Number 9
05.11Delayed implementation of EID eartag rule requested
05.11Why forage is the cornerstone of a working ranch horses diet
More »