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Agilent Technologies' Waveform Generator/Fast Measurement Unit Used In NBTI Industry Defining Solution Research At IIT Bombay

2014-06-06 12:25:30| rfglobalnet Home Page

Agilent Technologies Inc. recently announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.

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