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Atomic Force Microscope offers scanning microwave microscopy.

2013-07-03 14:29:34| Industrial Newsroom - All News for Today

Compatible with Model 5500 AFM, Scanning Microwave Microscopy mode combines compound, calibrated electrical measurement capabilities of microwave vector network analyzer with spatial resolution of atomic force microscope. SMM nose cone is particularly useful for testing and characterizing semiconductors. It enables complex impedance measurements, and can be used to acquire calibrated capacitance and dopant density measurements as well. This story is related to the following:Mechanical Components and AssembliesSearch for suppliers of: Nose Cones

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