Home › Is Stress the Root of Tin Whisker Growth?
 

Keywords :   


Is Stress the Root of Tin Whisker Growth?

2013-11-01 06:00:00| Industrial Newsroom - All News for Today

Eric Chason, Ph.D., professor of engineering at Brown University, will present his tin whisker research at 7th International Tin Whiskers Symposium, which will take place November 12–13, 2013 in Costa Mesa, CA. His presentation, "Real Time Study of Whiskers/Hillock Formation in Sn-Cu Systems During Thermal Cycling," will provide information on systematic experiments conducted to confirm that stress from intermetallics causes tin whiskers to form. This story is related to the following:Trade Associations

Tags: growth stress root tin

Category:Industrial Goods and Services

Latest from this category

All news
31.10Consolidated Financial Statements for the six-month period ended September 30, 2024
31.10Notice regarding the revision of the business results forecasts
Industrial Goods and Services »
05.11Registration Now Open for RadTech 2025
05.11Atlantic Tropical Weather Outlook
05.11Eastern North Pacific Tropical Weather Outlook
05.11Tropical Storm Rafael Graphics
05.11Tropical Storm Rafael Public Advisory Number 7A
05.11Summary for Tropical Storm Rafael (AT3/AL182024)
05.11Vodafone-Three merger could get green light, watchdog says
05.11Altice USA residential video RGUs down 77,000 in 3Q 2024
More »