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ZEISS Crossbeam Sets New Standards in 3D Nanotomography and Nanofabrication
2014-03-20 05:00:00| Industrial Newsroom - All News for Today
Fast Materials Processing and High Resolution Imaging<br /> <br /> JENA, REGENSBURG/Germany<br /> ZEISS will be presenting the first system of the new Crossbeam series at the MC 2013 in Regensburg, Germany. Its outstanding features include high speed in materials analysis and processing and its wide diversity of applications. Time intensive 3D experiments that used to run for several days can now be completed overnight.<br /> <br /> The newly developed focused ion beam (FIB) column enables ...This story is related to the following:Laboratory and Research Supplies and EquipmentSearch for suppliers of: Research Microscopes
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