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Tag: tektronix
IBM's SiGe RF Front End Chip Tech For Tektronix' 70GHz Scopes
2013-07-26 10:02:04| wirelessdesignonline News Articles
Tektronix said its 70 GHz real-time oscilloscopes to feature IBM's latest 9HP silicon-germanium (SiGe) chip-making process.
Tektronix Adds To Industry-Leading Performance Mixed Signal Oscilloscope Family
2013-07-26 06:58:07| rfglobalnet News Articles
Tektronix, Inc., the world's leading manufacturer of oscilloscopes, recently introduced the new MSO/DPO70000DX Series of performance oscilloscopes that feature models with 23GHz, 25GHz, and 33GHz bandwidth and enhanced tools for debugging digital and analog circuits.
Tags: family
performance
mixed
signal
Tektronix To Showcase Industry Leading Real-Time Signal Analysis Portfolio At 2013 MTT-S IMS Event
2013-05-29 02:40:25| rfglobalnet Home Page
Tektronix, Inc., a leading, worldwide provider of test, measurement and monitoring instrumentation, announced the company will feature the industry’s most extensive and advanced set of RF and Microwave signal generation and analysis solutions at the IEEE MTT-S 2013 International Microwave Symposium (IMS) June 4-6 in booth #820.
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industry
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leading
Tektronix to Showcase Industry Leading Real-Time Signal Analysis Portfolio at 2013 MTT-S IMS ...
2013-05-28 06:00:00| Industrial Newsroom - All News for Today
Applications Span Spectrum Management, Radio Communications, Radar, Electronic Warfare and WLAN Signal Testing<br /> <br /> BEAVERTON, Ore. – Tektronix, Inc., a leading, worldwide provider of test, measurement and monitoring instrumentation, announced the company will feature the industry's most extensive and advanced set of RF and Microwave signal generation and analysis solutions at the IEEE MTT-S 2013 International Microwave Symposium (IMS) June 4-6 in booth #820. Tektronix will ...This story is related to the following:Optics and PhotonicsWaveform Generators |
Tags: industry
analysis
leading
signal
Tektronix to Showcase ASIC Prototyping Debug Solution at Design Automation Conference 2013
2013-05-13 06:00:00| Industrial Newsroom - All News for Today
Attendees Will Experience Firsthand RTL Simulation-Level Visibility to Multi-FPGA Prototypes Eliminating Recompiles for Faster, More Efficient Debug<br /> <br /> BEAVERTON, Ore. -- Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, today announced it will showcase its recently introduced Certus 2.0 ASIC prototyping debug solution at the 2013 Design Automation Conference in Austin, TX, June 2-6, Booth 819. DAC is the premier conference devoted to ...This story is related to the following:Logic Analyzers | Debugging Software |
Tags: design
solution
conference
automation
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