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METTLER TOLEDO Announces FastTrack UV/VIS Spectroscopy To Speed Up Measurements
2016-01-12 05:15:06| metrologyworld News Articles
The new UV/VIS Excellence product portfolio includes four models that provide outstanding optical performance: UV5, UV7, UV5Bio and UV5Nano.
Tags: speed
measurements
announces
toledo
Dynamic Light Scattering Measurements On Latex Standards
2016-01-11 11:50:37| chemicalonline Downloads
Dynamic light scattering (DLS) is used to measure the size of small particles in suspension and of macromolecules in solution. When light is passed through such a sample, the particles scatter the light. Because the particles are constantly moving, the scattering intensity in any one direction fluctuates according to the particles' velocity. Since a particle's velocity depends on its size, the particle size in a given sample can be derived from DLS measurements. In this Application Report, we use polymer latex spheres ranging from 22 nm to 9200 nm in diameter to verify the DLS performance.
Tags: light
standards
dynamic
measurements
Dynamic Light Scattering Measurements On Latex Standards
2016-01-11 11:50:37| oilandgasonline Downloads
Dynamic light scattering (DLS) is used to measure the size of small particles in suspension and of macromolecules in solution. When light is passed through such a sample, the particles scatter the light. Because the particles are constantly moving, the scattering intensity in any one direction fluctuates according to the particles' velocity. Since a particle's velocity depends on its size, the particle size in a given sample can be derived from DLS measurements. In this Application Report, we use polymer latex spheres ranging from 22 nm to 9200 nm in diameter to verify the DLS performance.
Tags: light
standards
dynamic
measurements
New Functionality for Dynamic Resistance Measurements
2016-01-05 18:28:00| Transmission & Distribution World
The latest software version 3.40 of the CPC 100 Toolset and Primary Test Manager includes the new OLTC scan function. read more
Tags: dynamic
resistance
measurements
functionality
Procedure For A Higher Accuracy Receiver Calibration For Use In mm-Wave Noise Figure Measurements
2016-01-04 11:19:10| rfglobalnet Downloads
The VectorStar™ Noise Figure Option 41 employs a cold source method using terminations and absolute power measurements to provide noise figure measurements for frequencies from 70 kHz to 110 GHz. This cold source noise figure measurement removes the errors associated with mismatch differences between the hot and cold states of the source, and simplifies calibration and traceability. It also provides traceability paths through the power sensor, and the traceability information is usually readily available, compared to what can happen with the calibration requirements of the noise source.
Tags: higher
figure
accuracy
procedure
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