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Deployment of LabVIEW Drivers for the R&SCompactTSVP
2013-11-15 10:58:53| rfglobalnet Downloads
This application note describes the procedure used to install and deploy the LabVIEW driver libraries for the R&S CompactTSVP.
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Creating LabVIEW Drivers for the R&S CompactTSVP by Using GTSL Shared Library Import
2013-11-15 10:54:59| rfglobalnet Downloads
This application note describes the procedure used to create LabVIEW driver libraries by importing *.DLL files from the GTSL (Generic Test Software Library) development framework for the R&S CompactTSVP.
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creating
import
shared
National Instruments and MARA Set up LabVIEW Academies to Enhance the Engineering Education ...
2013-10-07 06:00:00| Industrial Newsroom - All News for Today
JOHOR, Malaysia –<br /> <br /> - National Instruments signs MoU with Majlis Amanah Rakyat (MARA)<br /> - The LabVIEW Academies features classroom curricula and hands-on exercise to undergraduates and graduates from MARA<br /> - NI and MARA collaborate to promote more LabVIEW-trained and LabVIEW-certified engineers to the electrical and biomedical engineering industries<br /> <br /> National Instruments (NI) has entered a strategic collaboration with Majlis Amanah Rakyat (MARA) to set up ...This story is related to the following:Green & CleanSearch for suppliers of: Training Aids, Programs & Systems | Educational Software
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New LabVIEW Driver Available for Elsys TraNET Devices and TPCX/TPCE Transient Cards
2013-09-10 06:00:00| Industrial Newsroom - All News for Today
Expanded software driver compatibility simplifies development for data acquisition systems<br /> <br /> Monroe, NY – Elsys Instruments, a leading manufacturer of custom and standard fast, high-precision data acquisition systems, has developed a new software driver that makes Elsys' entire range of highly accurate data acquisition products fully compatible with LabVIEW. <br /> <br /> Comprised of a set of virtual instruments (VIs), the LabVIEW driver supports all of the advanced data ...This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Disk Drive Drivers | Remote Monitoring & Reporting Data Acquisition Systems | Data Acquisition Systems |
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PXI And LabVIEW Meet Next-Generation Load Pull Measurement Speed Challenges
2013-06-07 07:24:24| rfglobalnet News Articles
Recently at the International Microwave Symposium, National Instruments (NATI) announced joint development on load pull solutions from Anteverta Microwave, Focus Microwaves, Maury Microwave and Mesuro.
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speed
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