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AFM Accessory enables scanning electrochemical microscopy.

2014-05-20 14:30:58| Industrial Newsroom - All News for Today

AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, using Agilent atomic force microscope, lets scientists perform scanning electrochemical microscopy with nanoscale resolution on conductive and insulating samples. Enabling immediate data collection, EC SmartCart cartridge combines nanoelectrode with pre-mounted AFM tip. Features include bi-functional probes, in situ research capabilities, built-in potentiostat, dual-chamber glove box, and Agilent PicoView software. This story is related to the following:Microscope Accessories |

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