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Akrometrix Announces Automated Die Attach Tilt Metrology

2016-03-01 11:31:07| Industrial Newsroom - All News for Today

ATLANTA, GA  Akrometrix LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced that it has developed an automated die-board (or daughter-mother board) attach tilt metrology. All Akrometrix shadow moire or...

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