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Atom Probe Microscope delivers 3D sub-nanometer analysis.

2014-08-08 15:45:09| Industrial Newsroom - All News for Today

Housed in ergonomic platform, LEAP® 5000 offers 3-dimensional nano-scale surface, bulk, and interfacial materials analysis with atom-by-atom identification and accurate spatial positioning. System comes with redesigned detection system, advanced laser control, accelerated data collection, and real-time monitoring capabilities. Microscope provides analytical accuracy, sensitivity, and 3D spatial resolution across wide variety of metals, semiconductors, and insulators. This story is related to the following:Optics and PhotonicsResearch Microscopes | Atomic Force Microscopes |

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