Suited for polymer and material science applications, Cypher™ ES Polymer Edition comes with 3 nanomechanical characterization tools. These include 2 atomic force microscope (AFM) techniques – AM-FM and Contact Resonance Viscoelastic Mapping Modes – and Fast Force Mapping Mode. In addition to blueDrive™ photothermal excitation option, microscope supports environmental control via sample heater (250°C max) that integrates without extra cables, tubing, or controllers.