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Atomic Force Microscope supports accelerated testing.

2013-12-06 14:32:14| Industrial Newsroom - All News for Today

Using electromagnetic actuation for optimal force and displacement, Nano Indenter G200 supports Express Test option that accelerates nanoindentation for mechanical-properties mapping. Express Test delivers precision data on various materials, and allows up to 100 indents to be performed at 100 different surface sites in 100 sec. Furthermore, Express Test enables atomic force microscope to be operated in controlled-force or controlled-displacement mode. This story is related to the following:Atomic Force Microscopes

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