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Atomic Force Microscopes can measure elastic, viscous properties.

2014-09-04 14:31:31| Industrial Newsroom - All News for Today

Leveraging AM-FM Viscoelastic Mapping Mode, Cypher™ and MFP-3D™ atomic force microscopes (AFMs) lets users image viscoelastic properties, including storage modulus and loss tangent, with nanoscale spatial resolution. Nanomechanical imaging technique operates at 2 cantilever resonances simultaneously. First resonance is used for tapping mode imaging, or amplitude modulation (AM), while higher resonance mode is operated in frequency modulation (FM). This story is related to the following:Atomic Force Microscopes

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