Available exclusively for Cypher™ and MFP-3D™ Atomic Force Microscopes, Contact Resonance Viscoelastic Mapping Mode enables high-resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus. Technique is particularly well-suited for characterizing moderate to high modulus materials in range of 1–200 GPa, such as composites, thin films, biomaterials, polymer blends, and even ceramics and metals.
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