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Atomic Force Microscopes offer Contact Resonance mode.

2013-09-20 14:30:20| Industrial Newsroom - All News for Today

Available exclusively for Cypher™ and MFP-3D™ Atomic Force Microscopes, Contact Resonance Viscoelastic Mapping Mode enables high-resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus. Technique is particularly well-suited for characterizing moderate to high modulus materials in range of 1–200 GPa, such as composites, thin films, biomaterials, polymer blends, and even ceramics and metals. This story is related to the following:Atomic Force Microscopes

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