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Atomic Force Microscopes sense both resistance and capacitance.

2014-01-27 14:31:31| Industrial Newsroom - All News for Today

Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs. Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including ferroelectrics, piezoelectrics, and low-dimensional nanomaterials such as graphene and boron nitride. This story is related to the following:Atomic Force Microscopes

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