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Boundary-Scan Suite offers cluster testing support.
2013-05-02 14:28:19| Industrial Newsroom - All News for Today
Broadening structural and functional test capabilities, ScanExpress Boundary-Scan Tool Suite v7.8 features model-based test coverage, which limits test vector generation to nets where all nodes have been identified with device model. Cluster definitions are assignable by pin numbers in addition to net name. TPG parsing engine will automatically ignore leading P values found in pin definitions for non-BGA type BSDL files. In addition, v7.8 expands JET support to TI AM335x Sitara™ processors. This story is related to the following:Vision SystemsTesting Software | Scanning Software | Electronic Design Automation (EDA) Software |
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Category:Industrial Goods and Services