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Determining the Phosphorus Content and Thickness of Electroless Nickel Coatings Using XRF

2013-05-30 06:00:00| Industrial Newsroom - All News for Today

Fischer Technology is pleased to announce the capability of non-destructively measuring simultaneously the phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). For the first time this capability is realized for measurements in air (vacuum free), regardless of the underlying base material, AL, Fe, Cu or PCB. Fischer’s high performance XRF hardware combined with user- friendly advanced fundamental parameter software allows ...This story is related to the following:Sensors, Monitors and TransducersX-Ray Testers | Measuring Instruments | X-Ray Fluorescence (XRF) Analyzers

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