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Digital Stimulus/Response Module aids RF chipset testing.
2015-02-13 14:30:21| Industrial Newsroom - All News for Today
Featuring parametric measurement unit (PMU), 16-channel PXIe digital stimulus/response module offers accelerated and flexible RF chipset test emulation and device characterization. Pattern cyclizer technology enables on-the-fly pattern creation for single site or up to 4 independent multi-sites with high-voltage channels and open drain pins for simultaneous device test. Capable of emulating serial and parallel digital device interfaces, module offers 1 ns-per-bit edge placement resolution.
Tags: digital
testing
aids
module
Category:Industrial Goods and Services
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