Leveraging energy dispersive X-ray fluorescence (ED-XRF) technology, SPECTRO XEPOS spectrometers handle multi-elemental analysis of major, minor, and trace element concentrations. Adaptive excitation as well as tube and detector technologies maximize sensitivity and minimize detection levels. To prevent on/off variations from affecting readings, X-ray tubes remain powered on between measurements. System's speed results in analysis of most samples within few minutes.