Equipped with electronically cooled semiconductor detector, Model EDX-7000 provides measurement range of 11 Na to 92 U, while Model EDX-8000 offers range of 6 C to 92 U. Both energy dispersive X-ray fluorescence spectrometers feature 5 primary filters that enable sensitive analysis of trace elements, and sample observation camera for precise sample positioning. Large sample chamber accommodates virtually any sample type, including thin films, powders, slurries, emulsions, and liquids.
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