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How to do Functional Tests on I2C and SPI Monitors with JTAG is Explored in New eBook from ...

2013-05-08 06:00:00| Industrial Newsroom - All News for Today

Richardson, TX &ndash; A new eBook from ASSET® InterTech (<a href="http://www.asset-intertech.com">www.asset-intertech.com</a>), the leading supplier of tools for embedded instrumentation, explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production.<br /> <br /> Devices such as temperature sensors, electrical sensors and others ...

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