Home How to do Functional Tests on I2C and SPI Monitors with JTAG is Explored in New eBook from ...
 

Keywords :   


How to do Functional Tests on I2C and SPI Monitors with JTAG is Explored in New eBook from ...

2013-05-08 06:00:00| Industrial Newsroom - All News for Today

Richardson, TX &ndash; A new eBook from ASSET® InterTech (<a href="http://www.asset-intertech.com">www.asset-intertech.com</a>), the leading supplier of tools for embedded instrumentation, explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production.<br /> <br /> Devices such as temperature sensors, electrical sensors and others ...

Tags: from new tests functional

Category:Industrial Goods and Services

Latest from this category

All news

19.11POWTEX2024 The 25th International Powder Technology Exhibition Tokyo
Industrial Goods and Services »
23.11contactglove tundratracker
23.11
23.11RUSSELUNO
23.11C282 800yd IP54
23.11X-FLY4 27.5
23.118
23.11 (1~40)
23.1101DVDBOX
More »