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› In the Ramp Light in Las Vegas: JTAG Technologies Inside - The Future of Your ATE Application with Boundary-Scan
In the Ramp Light in Las Vegas: JTAG Technologies Inside - The Future of Your ATE Application with Boundary-Scan
2016-03-16 11:31:10| Industrial Newsroom - All News for Today
IPC Apex 2016 Las Vegas, Booth 2413 Eindhoven, the Netherlands What test engineers worry about these days: the access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage. JTAG Technologies motto for Apex 2016 year reads: Optimise your ATE...
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