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JTAG Boundary Scan Tester features desktop form factor.

2013-05-07 14:31:09| Industrial Newsroom - All News for Today

Combining all test electronics and basic mechanics, modular JULIET™ series supports all Embedded System Access (ESA) technologies for high-speed, in-system programming of Flash, PLD, and MCU as well as structural and functional at-speed board test. In addition to Boundary Scan, unit supports such test strategies as Processor Emulation and Chip Embedded Instruments respectively based on VarioTAP® and ChipVORX® technologies. Universal adaptors are supplied as standard. This story is related to the following:Electronic Testers

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Category:Industrial Goods and Services

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