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Metrology CT System offers magnification up to 200x.

2013-05-28 14:29:38| Industrial Newsroom - All News for Today

Based on actively cooled, 225 kV micro-focus X-ray source, MCT225 HA supports range of sample sizes and material densities with 3.8+ L/50 µm MPEl accuracy in accordance with VDI/VDE 2630 guideline. System features manipulator guideways equipped with high-resolution optical encoders. Guideways are error corrected using laser interferometer mapping techniques. To minimize thermal effects, interior of enclosure is temperature controlled, creating conditioned measurement room stable to 20°C ±0.1°C. This story is related to the following:Test and Measuring InstrumentsCT Scanners | Metrology Equipment

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