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More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool for ...

2013-10-01 06:00:00| Industrial Newsroom - All News for Today

MIGDAL HAEMEK, Israel &ndash; Jordan Valley Semiconductors [<a href="http://www.jordanvalley.com">http://www.jordanvalley.com</a>] Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers. The system has been purchased for advanced process development and production ramp-up for 14nm and ...This story is related to the following:Laboratory and Research Supplies and EquipmentX-Ray Inspection Systems | Metrology Instruments

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