Home New High-Speed Piezo Z-Stage and Digital Controller Value Packages for Microscopy / Metrology, Released by PI
 

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New High-Speed Piezo Z-Stage and Digital Controller Value Packages for Microscopy / Metrology, Released by PI

2016-02-01 11:31:12| Industrial Newsroom - All News for Today

Auburn, MA Industry leader in motion and precision positioning components and systems PI (Physik Instrumente) L.P. has released several controller stage value packages for microscopy and metrology applications. These affordable systems consist of a PIFOC high performance fast piezo focus mechanism and a compact...

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