Supplied in .4 mm and .5 mm sizes, ZIP® Z0 and Z1 contacts are available with HyperCore™ non-plated homogenous base material specifically designed for use in semiconductor testing. Conductive material possesses properties that prevent oxidation, ensuring optimum performance throughout high-volume production cycles. With 600+ Knoop hardness, material is inert to common wear related to contacting tough device surfaces and cleaning processes.
This story is related to the following:Electrical Contacts |