Home › Rigaku Announces The NANOHUNTER II Benchtop Total Reflection X-ray Fluorescence (TXRF) Spectrometer
 

Keywords :   


Rigaku Announces The NANOHUNTER II Benchtop Total Reflection X-ray Fluorescence (TXRF) Spectrometer

2015-09-11 06:36:17| metrologyworld Home Page

X-ray scientific, analytical and industrial instrumentation manufacturerRigaku Corporation, (3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, JAPAN Tel: 042-545-8111; President: Hikaru Shimura) has announced the next generationRigaku NANOHUNTER IIbenchtop total reflection X-ray fluorescence (TXRF) spectrometer that enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level

Tags: total reflection announces fluorescence

Category:Industrial Goods and Services

Latest from this category

All news
17.06New Federal Government Filing Requirement Regarding Ownership of LLCs and Corporations
17.06Manufacturers Reps That Sell to International Customers June 26 Networking Event
17.06Avoid $591 Daily Penalty From the U.S. Treasury Department
15.06With Gratitude for a Job Well Done
Industrial Goods and Services »
18.06Mondi Jackson wins 2024 FTA Excellence in Flexography Award
17.06Chemours Appoints Shane Hostetter Chief Financial Officer
17.06Potential Tropical Cyclone One Graphics
17.06Potential Tropical Cyclone One Forecast Discussion Number 1
17.06Potential Tropical Cyclone One Wind Speed Probabilities Number 1
17.06Potential Tropical Cyclone One Public Advisory Number 1
17.06Summary for Potential Tropical Cyclone One (AT1/AL012024)
17.06Potential Tropical Cyclone One Forecast Advisory Number 1
More »