Home Rigaku Announces The NANOHUNTER II Benchtop Total Reflection X-ray Fluorescence (TXRF) Spectrometer
 

Keywords :   


Rigaku Announces The NANOHUNTER II Benchtop Total Reflection X-ray Fluorescence (TXRF) Spectrometer

2015-09-11 06:36:17| metrologyworld Home Page

X-ray scientific, analytical and industrial instrumentation manufacturerRigaku Corporation, (3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, JAPAN Tel: 042-545-8111; President: Hikaru Shimura) has announced the next generationRigaku NANOHUNTER IIbenchtop total reflection X-ray fluorescence (TXRF) spectrometer that enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level

Tags: total reflection announces fluorescence

Category:Industrial Goods and Services

Latest from this category

All news

18.06A Request From the A League of Their Own Womens Special Interest Group
18.06Next MANAchat Series is Scheduled for the Week of August 5
17.06New Federal Government Filing Requirement Regarding Ownership of LLCs and Corporations
17.06Manufacturers Reps That Sell to International Customers June 26 Networking Event
17.06Avoid $591 Daily Penalty From the U.S. Treasury Department
15.06With Gratitude for a Job Well Done
Industrial Goods and Services »
26.06PPG to Announce Second-quarter 2024 Results July 18
26.06Fresh Coat for First Responders: New Hampshire Fire Station Gets a Makeover by California Paints
26.06Michigan Sets Record Recycling Rate in 2023, Recycles Nearly 70,000 Tons of Materials
26.06Companies Seek Federal EPR: How Producers Can Prepare
26.06Q&A with GFLs Tyler Stefure: Integrating New Fleet Tech & Upholding GFL Values
26.06SWANA Publishes Report on the Performance of Seattles Zero Waste System
26.06Baltimore Sues Major Brands for Alleged Role in Plastic Pollution Crisis
26.06Petco Aims Sight at Large-Scale Recycling Program to Divert LDPE Plastic from Landfills
More »