Volpiano (TO)<br />
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Volpiano (TO), Italy – SEMICON CHINA 2014 – the semiconductor trade show held in Shanghai 18th to 20th March, was a big success for SPEA. Crowds of visitors flocked to SPEA's booth during the three days of trade show. Chinese and international visitors showed their interest in the new DOT 100 MEMS Device-Oriented Tester – the revolutionary test system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly ...This story is related to the following:Integrated Circuit Testers |