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Touchless 1-Pixel Laser Tracker Probe advances spatial metrology.

2015-11-06 14:31:07| Industrial Newsroom - All News for Today

Pixel Probe, a recent invention within NIST CTL, features in 2015 Autumn Journal of the Coordinate Metrology Society Conference. Used with laser tracker, this spatial metrology probe allows resolution to 25 microns without physical contact. Three machine vision cameras project single pixel to one location in space that defines touch-less probe. Benefits derived from this probe will provide data from objects difficult or extremely challenging to measure using existing tracker probes.

Tags: laser tracker advances probe

Category:Industrial Goods and Services

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