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Teledyne LeCroy Showcases 100 GHz Bandwidth and Test Technology Innovations at DesignCon 2014

2014-01-21 06:00:00| Industrial Newsroom - All News for Today

CHESTNUT RIDGE, N.Y. and SANTA CLARA, Calif. – Teledyne LeCroy will be showcasing the latest innovations in test technology at the DesignCon 2014 exhibition in Santa Clara, January 28-30. A highlight of the exposition will be the 100 GHz bandwidth oscilloscope preview and technology discussion in booth 209. Product exhibits will demonstrate continued leadership in the speed, performance and analysis capabilities of oscilloscopes and signal integrity test solutions. Products featured at ...This story is related to the following:Electronic Components and Devices Sponsored by: Globtek Inc. - Your Power Partner...For Over 20 Years!Electronic Signals | Digital Storage Oscilloscopes | Signal Instruments |

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GeneSeek Now Offers Rapid PEDV Test

2014-01-21 01:00:00| ThePigSite - Industry News

US - Neogen Corporation announced today the immediate availability of a new test to rapidly and accurately detect porcine epidemic diarrhea virus (PEDV). Early detection of the virus is critical to stop its spread from farm to farm, and between facilities within a pig farm or pig production site.

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Video Demonstrates Live Test with DC Hipot

2014-01-20 22:45:00| Transmission & Distribution World

Haefely Hipotronics has launched a new DC Hipot How-To Video. read more

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Compliance Test Software targets HDMI 2.0 devices.

2014-01-20 14:31:19| Industrial Newsroom - All News for Today

Designed for physical-layer testing of devices that use HDMI 2.0 specification, Transmitter Compliance Test Software allows engineers to use Infiniium oscilloscopes to test HDMI 2.0 transmitters. Software can store and recall previous user set-ups, and includes test-plan control to guide users through all tests. Receiver Compliance Test Software can be used with transition-minimized differential-signaling signal generator and Agilent M8190A arbitrary waveform generator to test HDMI 2.0 receivers. This story is related to the following:Testing Software |

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Parametric Test System offers comprehensive diagnostics.

2014-01-20 14:31:19| Industrial Newsroom - All News for Today

To ensure system health, Model S530 includes GUI-driven tool that expands diagnostic coverage for all system instrumentation and matrix pathways. KTE v5.5 addresses all I-V and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization. In addition to 200 V system configuration used for standard CMOS, bipolar, and MEMS processes, 1 kV version is available for difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS devices demand. This story is related to the following:Semiconductor Testers | Test Systems

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