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Wafer Analysis System quickly diagnoses root cause of defects.
2013-06-13 14:32:33| Industrial Newsroom - All News for Today
With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in diameter. By moving 1200AT close to wafer process line, process development and ramp are accelerated. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Wafer Inspection Systems |
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analysis
quickly
root
Indium Corporation Technology Expert to Deliver Webtorial on Top Pb-free PCB Assembly Defects
2013-06-04 06:00:00| Industrial Newsroom - All News for Today
<a href="http://www.indium.com/">Indium Corporation</a>’s <a href="http://www.indium.com/biographies/tim-jensen/">Tim Jensen</a>, Product Manager – PCB Assembly Materials, will present a two-part webtorial, titled Top Pb-Free PCB Assembly Defects: Cause and Cure, as part of a webtorial series sponsored by the <a href="http://www.smta.org/">SMTA</a>. The webtorials are scheduled from 1-2:30 p.m. EDT on June 11 and 25.<br /> <br /> This two-part webtorial will discuss the top PCB ...
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technology
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expert
Indium Corporation Technology Expert to Deliver Webtorial on Top Pb-free PCB Assembly Defects
2013-06-04 06:00:00| Industrial Newsroom - All News for Today
Indium Corporation’s Tim Jensen, Product Manager - PCB Assembly Materials, will present a two-part webtorial, titled Top Pb-Free PCB Assembly Defects: Cause and Cure, as part of a webtorial series sponsored by the SMTA. The webtorials are scheduled from 1-2:30 p.m. EDT on June 11 and 25.<br /> <br /> This two-part webtorial will discuss the top PCB assembly-related defects, including printing insufficients, solder hole-fill, false failures at in-circuit test (ICT), graping, ...
Tags: top
technology
corporation
expert
AOI System identifies defects during PCB production.
2013-05-30 14:29:08| Industrial Newsroom - All News for Today
Equipped with 5 megapixel color camera and Fusion Lighting™, Automated Optical Inspection System integrates several image processing techniques, including color inspection, normalized correlation, and rule-based algorithms, providing high-speed PCB inspection. System uses one top down viewing camera and 4 side viewing cameras to inspect solder joints and verify correct part assembly. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Printed Circuit Board (PCB) Inspection Systems |
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production
defects
identifies
Weld Check System detects defects in minutes.
2013-05-08 14:30:59| Industrial Newsroom - All News for Today
Consisting of 3-step system, Weld Check™ starts with Weld Check™ Weld Cleaner and Penetrant Remover, which removes dirt and contaminants from surface to be analyzed. User then applies Weld Check™ red liquid penetrant for non-destructive testing of surfaces and structures. After Weld Check™ Developer is left on surface for 5–15 min, defects will appear red in color. Process can detect cracks, lack of fusion, and open cavities in welded parts, porosity or leaks, discontinuities, laps, and folds. This story is related to the following:Surface Defect Detection Systems |
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check
minutes
defects
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