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Tag: reliability
MACOM's New 600 W GaN On SiC Pulsed Power Transistor Delivers Industry's Highest Reliability Rating And Lowest Pulse Droop
2013-09-20 04:15:38| wirelessdesignonline News Articles
M/A-COM Technology Solutions Inc. (“MACOM”), a leading supplier of high-performance RF, microwave and millimeter wave products, recently announced a new ceramic GaN on SiC HEMT Power Transistor for avionics applications.
Tags: power
rating
highest
lowest
ComEd Advances System Reliability
2013-09-13 17:35:00| Transmission & Distribution World
By Jeff Gates, Commonwealth Edison Co. Existing distribution automation schemes improved through use of advanced reclosing technology. read more
Tags: system
reliability
advances
comed
Electrical Double-Layer Capacitors offer long-term reliability.
2013-09-13 14:30:32| Industrial Newsroom - All News for Today
Exhibiting 5-year reliability at 70°C, DMT series has 85°C max operating temperature; 130 mW resistance (high-current, high-output charging and discharging); and 470 mF nominal capacitance. Design enables voltage handling to 4.2 V, and physical dimensions are 14 x 21 x 3.5 mm. Suitable applications include SSD and communication system backup, power assistance for smart meters, and energy-harvesting devices. This story is related to the following:Capacitors
Tags: offer
electrical
reliability
capacitors
Micrologic Software Reliability Solution For The Development Of The Next Semiconductor Transistor (Chip) Generation
2013-09-13 03:02:01| electronicsweb News Articles
Micrologic Design Automation, Inc. ("MDA"), a leader in software development for electronic manufacturers, today announced the new release of its nanoRV tool for enhanced reliability and performance of custom and semi-custom integrated circuit (IC) layouts
Tags: software
development
solution
generation
IPC Event Focuses on Real-world Approach to Electronics Reliability
2013-09-12 06:00:00| Industrial Newsroom - All News for Today
Taking place in Costa Mesa, CA from November 13–14, IPC Conference on Solder and Reliability will include presentations addressing strategic considerations related to solder alloys, defects, risk mitigation processes, and data analysis. Speakers Ron Lasky, Ph.D.; Rick Short; Cheryl Tulkoff; Rich Brooks; Lenora Toscano; Larry Bright; John McMahon; James Wade; Jim Ryan; Reza Ghaffarian, Ph.D.; and Michael Neilsen will provide insights into electronics reliability challenges. This story is related to the following:Trade Associations
Tags: event
electronics
approach
reliability
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