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2014-04-09: Press release: 3D measurement of the finest and optical surfaces
2014-04-09 00:00:00| Mahr
Ideal for the quality assurance of optics: MarSurf WM 100 from Mahr New: Measuring station MarSurf WM 100 measures in the sub-nanometer range The new white light interferometer MarSurf WM 100 from Mahr is ideal for fast measurements of fine and finest surface details in the nanometer range. The measurement method records an area and within just a few seconds, meaningful topographic...
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Category:Textiles and Nonwovens