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3D Surface Measuring Systems use white light/confocal microscopy.
2014-06-04 14:30:31| Industrial Newsroom - All News for Today
MarSurf® WM 100, which uses white light interferometer, and MarSurf CWM 100, which includes white light and confocal microscopy, are intended for measuring optical, technical, and reflecting surfaces and provide 3D topographical analysis. Both systems provide non-contact measurement of surface structures with sub-nanometer resolution. While confocal microscopy better serves measurement of dark surface structures, white light interferometry suits polished, shiny surfaces. This story is related to the following:Measuring Instruments | Surface Mount Assembly Equipment Inspection Systems | Surface Inspection Systems
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Category:Industrial Goods and Services