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AFM Probes offer automated calibration.

2013-09-06 14:30:26| Industrial Newsroom - All News for Today

Supplied with MFP-3D™ and Cypher™ atomic force microscope probes, GetReal™ Automated Probe Calibration feature fully calibrates probe sensitivity and spring constant, enabling consistent, accurate results. Based on thermal noise method and Sader method, non-contact calibration also protects probe from damage that occurs with conventional calibration methods, preserving sharpest tip for highest resolution imaging. This story is related to the following:Optics and Photonics Sponsored by: OFS Specialty Photonics Div - OFS Cat Sponsor for Vert Banner replacementProbes | Calibration Management Software

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