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Home › Agilent Technologies' New Multi-Channel PXI-Based Test Solution Speeds LTE/LTE-Advanced Waveform Creation And Analysis

 

Agilent Technologies' New Multi-Channel PXI-Based Test Solution Speeds LTE/LTE-Advanced Waveform Creation And Analysis

2014-06-26 10:03:54| wirelessdesignonline News Articles

Agilent Technologies Inc. recently announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs.

Tags: test analysis solution technologies

Category:Telecommunications

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