Home Agilent Technologies' New Multi-Channel PXI-Based Test Solution Speeds LTE/LTE-Advanced Waveform Creation And Analysis
 

Keywords :   


Agilent Technologies' New Multi-Channel PXI-Based Test Solution Speeds LTE/LTE-Advanced Waveform Creation And Analysis

2014-06-26 10:03:54| wirelessdesignonline News Articles

Agilent Technologies Inc. recently announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs.

Tags: test analysis solution technologies

Category:Telecommunications

Latest from this category

All news

»
26.11yuma 1~60
26.11 GARMIN Approach S20
26.1135130
26.11HOTEL4 DVD-BOX
26.11 VHS
26.11 [LP] TRANSFORMER LOU REED
26.11
26.11 M
More »