Home Akrometrix LLC to Demonstrate 2D/3D Statistical Review Software at SMTAI ¨C Interface ...
 

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Akrometrix LLC to Demonstrate 2D/3D Statistical Review Software at SMTAI ¨C Interface ...

2014-08-01 06:00:00| Industrial Newsroom - All News for Today

ATLANTA, GA &ndash; Akrometrix LLC, the leader in elevated temperature surface characterization, will exhibit in Booth #541 at SMTA International, scheduled to take place Sep. 30 - Oct. 1, 2014 at the Donald Stephens Convention Center in Rosemont, IL. Company representatives will demonstrate the Interface Analysis software that allows allow high-level and in-depth review of the attachment interface between two surfaces that warp during a microelectronics production reflow profile.<br /> <br ...This story is related to the following:Utilities Software |

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