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Atomic Force Microscope offers several operational modes.

2013-05-17 14:31:21| Industrial Newsroom - All News for Today

Delivering closed-loop precision, Hi-Res imaging, and low-noise force measurements, MFP-3D Origin™ offers basic scan modes as well as nanolithography, Dual AC™, and piezoresponse force microscopy modes. Additional functionality may be added for optional modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunneling microscopy, and scanning thermal microscopy. Unit can be upgraded to full MFP-3D to utilize environmental and application accessories. This story is related to the following:Atomic Force Microscopes

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