Home DARPA Virtual Lab Advances DOD's Ability To Test Critical Microelectronics
 

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DARPA Virtual Lab Advances DOD's Ability To Test Critical Microelectronics

2014-12-12 01:50:59| rfglobalnet Home Page

Under the auspices of DARPA’s Integrity and Reliability of Integrated Circuits program, researchers from the Naval Surface Warfare Center (NSWC) and Air Force Research Laboratory (AFRL) are collaborating in powerful new ways to determine the reliability and integrity of microchips embedded in the some of the nation’s most critical military weapon and cyber systems.

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