Used for testing high frequency semiconductors in high-volume production, mmWave Contactor combines traditional spring probe architecture for low frequency and power I/O’s with cantilever solution for peripheral high frequency transceiver I/O’s. Keeping interface from test equipment to device as short as possible while minimizing number of transitions enables broadband performance from DC to 81 GHz to be maintained. Typical applications include automotive radar, WiGig, and 5G backhaul devices.