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Microscopy technique could help computer industry develop 3-D components

2013-06-29 17:03:59| Semiconductors - Topix.net

The technique, called Through-Focus Scanning Optical Microscopy , has now been shown able to detect tiny differences in the three-dimensional shapes of circuit components, which until very recently have been essentially two-dimensional objects.

Tags: computer industry develop components

Category:Electronics and Electrical

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