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Oxford Instruments' Releases New Cost-Effective Process Control Application for the ...
2013-08-19 06:00:00| Industrial Newsroom - All News for Today
Concord, MA — Oxford Instruments Industrial Analysis, a leading global supplier of high quality instruments used for materials identification and coating thickness gauging analysis announced today a new technical application report now available for Ag on PTZ ceramic compliant with the ISO3497 and ASTM B568 standard by using the X-Strata920 X-Ray Fluorescence (XRF) benchtop analyzer. <br /> <br /> The X-Strata920 XRF analyser was introduced by Oxford Instruments in 2012 for coating ...This story is related to the following:Sensors, Monitors and TransducersSearch for suppliers of: Coating Thickness Gages
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