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PXI-based Test System accelerates LTE waveform creation.
2014-07-07 14:30:40| Industrial Newsroom - All News for Today
Providing tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in frequency and modulation domains simultaneously, LTE/LTE-Advanced Multi-channel PXI-based Test Solution helps engineers gain deep insight into complex carrier aggregation and spatial multiplexing MIMO designs. Chassis backplane trigger tool configures and routes backplane triggers for proper time synchronization in MIMO configuration for up to 2 PXIe chassis. This story is related to the following:Communications Testers |
Tags: system
test
creation
waveform
Category:Industrial Goods and Services