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Scanning Slit Laser Beam Profiler features USB2 interface.

2013-02-11 14:32:44| Industrial Newsroom - All News for Today

Using moving slits, NIST-calibrated NanoScan 2 measures continuous wave (CW) and pulsed beams across spectral range from UV to far IR. Beam size and beam pointing can be measured with 3 sigma precision of several hundred nanometers. While USB2 interface provides deep, 12-bit digitization of signal for dynamic range up to 35 dB power, digital controller improves accuracy and stability of measurements. Software can measure 1–16 beams in NanoScan aperture, all with sub-micron precision. This story is related to the following:Optics and PhotonicsSearch for suppliers of:

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