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Teradyne Introduces Next Generation UltraFLEX Wireless Test Solution
2014-07-08 02:45:10| Semiconductors - Topix.net
This release expands on Teradyne's market-leading position by introducing a new RF instrument, the UltraWave24, a new DSP Processor, the UltraDSP1, and the latest version of the Enhanced Signal Analyzer Toolkit.
Tags: test
solution
generation
wireless
Category:Electronics and Electrical
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