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Test Hats - General Specification Brochure

2013-08-29 12:14:55| rfglobalnet Downloads

Test hats enable communication while containing the RF energy from an antenna. Haigh-Farr test hats are constructed out of a solid aluminum, one-piece case with a conductive EMI gasket where the hat is in contact with the ground plaine and the antenna. This provides a tight EMI seal, minimizing RF leakage, typically to -80 dB or lower.

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Category:Telecommunications

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